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Cambridge Advanced Imaging Centre


CAIC offers a wide range of specimen preparation techniques for both SEM and TEM samples as a full service as well as facilitating access to our Tecnai G2 TEM and Verios 460 SEM. Our services are available to university as well as external, commercial users. Before using our services, you will need to register with us and create an account and a project on our online booking system. If you would like advice on your project first, simply email Karin Müller for a consultation. Prior to using our electron microscopes you will need a 1h-training session, which you can request online via PPMS following registration or directly by email. For more detail on what we offer, please follow the links to the left.