Tecnai G2 80-200keV transmission electron microscope

Intermediate resolution scanning TEM for imaging in bright-field and STEM mode (installed in 2008/9)

• easy-to-use TEM for imaging of biological and materials samples
• accelerating voltages of 80, 120 and 200 keV
• LaB6 emission source
• bright-field imaging; SAED (selected area electron diffraction) for crystalline samples
• high angle annular darkfield STEM (HAADF-STEM) for Z-contrast imaging
• compu-stage with ± 60^o  stage tilt for 3D tomography
• bottom-mounted AMT CCD camera
• elemental analysis by EDX (Peltier-cooled Ametek silicone drift detector; Genesis/ Team software)
• two single tilt holders, one low background EDX holder, one tomography holder
• no cryo capability